The equipment is specially used in testing solar energy mono-crystalline silicon, poly-crystalline silicon, amorphous-crystalline silicon and solar cell module. It has unique apparatus of modifying, to input the compensate parameter, it will carries on non-touched way automatically/manual temperature compensation and compensate with light intensity and automatically measures and modifies the temperature. Base on the Windows operation interface and humanized-design testing software, it records and displays test curve(I-V curve, P curve)and the test parameter(Voc, Isc, Pm, Im, FF, EFF) the outcome of the test is prompted by voice, and the sequence number is automatically product and preserved to the assigned folder.Simulation photosource High efficiency pulses Xeon-lamp(Single pulse energy≥ 1200J) Luminous intensity irregularity ≤ ± 3% Test area 2*2m Test range 20W~300W Data acquisition speed 2ms Data acquisition quantity 8000data point(I-V Curve) Test Instability ≤ ± 0.5% Test load 10A/50V Test parameter Voc Isc Pm Im Vm FF EFF Test inaccuracy ≤ 2%
