Products character Adopts pulses Xeon-lamp as Simulation photosource, special material cavity reflection device realize high uniformity of the simulated sunlight, aviod the influence caused by temperature from steady-state sun simulator to the testing result Spectrum meet IEC60904-9 spectral irradiance distribution of requirements (AM1.5) Software can display the I-V curve of the interface record of the current work and automatically preserved main test parameter of all module to the assigned folder. The specified file can be self-named, support data summary and print. Test Parameter is including IscVocPmaxVmImFFEFFTempRS Rsh Application Used in the filtration of solar cell testing Equipment performance Spectrum meet IEC60904-9 spectral irradiance distribution of requirements (AM1.5) Light intensity 100mW/cm2 (20-120mW/cm2 Continuously adjustable) Nonuniformity: ± 3 B grade Instablity: ± 1 A grade 30000010ms Pulse width Import pulsed xenon lamp, lifetime ≥ 300 thousands Counting function of flashes(Zero reset when repalcement) Downwards light optics system 200mm*200mm Testing area: 200mm*200mm 0.1W~5W Testing Range: 0.1W~5W Testing temperature: 15º C~35º C(Resolution 0.1º C) Consistency of test result: ± 1 Electricity properties testing error: ≤ 1 Testing way: Adopts four-wire connection to measure cells, ensure the accuracy of measurement Test Parameter: IscVocPmaxVmImFFEFFTempRSRsh Test interval: 3s/piece Data acquisition: 14 bit four channel high-speed synchronous acquisition card, range 1/16384 Test condition calibration: Auto calibration device (including manual input compensation device, auto/manual temperature compensation, auto light intensity compensation ) Temperature measurement: Auto temperature measurement, and automatically calculate for temperature compensation for test result. Temperature modify functionModel specification SCT-B Simulation photosource Pulse Xeon-lamp The range of luminous intensity 70-120mW/cm² Luminous intensity irregularity ≤ ± 3% Test area 300*300mm Test time 3sec/piece Data acquisition quantity 8000 data point Test system Pc machine A/D control card, Display I-V curve andP curve Test parameter Voc Isc Pm Im Vm FF EFF
