Ecopia Probe Station is system used to get the electrical characteristics of samples through I-V and I-R properties of semiconductor wafer or device.It measures samples ,using microscope and probes minute distance and contacts the sample.Product Feature- Moving Z, using micrometer.- Including Plate Ring.- Chuck Size: 6",Travel (X:100 mm , Y:100mm, :360),Vacuum Adsorption, isolation.- Manipulator: EP-7, magnet type, Travel X-Y-Z 10mm, Adopted Plate Spring, 10um/pitch(or 5um/pitch)Product Specification / ModelsEPS-500EPS-1000ApplicationIt is used for measuring electrical properties of semiconductor samples, in electrical & electronic dept, material,physics and etc, for lab and industry. |